analyzeWaferMap scans for statistically significant spatial yield patterns across five families: rings, quadrants, angular sectors (16 compass directions), failure clusters (contiguous failing dies denser than background), and edge arcs (localised arc damage near the wafer perimeter). This wafer has a particle/ESD failure cluster, a handling arc near the wafer edge, and the natural radial yield gradient that drives ring and sector findings. The notebook icon in the toolbar opens the findings panel: click any finding to highlight the affected dies.