analyzeWaferLot surfaces patterns that repeat across multiple wafers and flags individual yield outliers. W01, W03, and W05 share the same edge-ring failure — detected as a repeated lot pattern. W06 has stacked failures and is flagged as a yield outlier. The findings panel (open on the right) lists all lot-level findings; each card also carries its own per-wafer findings accessible via the card's expand modal.