§11 — Summary panel Persistent summary panel showing metadata, yield, bins, regions, test values and findings. Gallery panel drills down to wafer detail on card-header click.
The summary panel shows yield, bin distribution, ring and quadrant breakdown, test value statistics, and findings — all in one persistent view alongside the map. The top example uses summaryPanel: { placement: 'right' } for a fixed always-visible panel. The gallery below uses lotStatsSummary for lot-level stats; click a card header to drill into that wafer's per-wafer summary.

Single wafer — summary panel (right)

Gallery — lot summary panel (right) · click a card header to drill into wafer detail