Examples¶
Live interactive demos. Each opens a standalone page rendered in the browser.
Start here¶
- Your first wafer map — minimal two-call example, no CSV
- Loading CSV data — parse and map real columnar data
- Geometry inference — omit die size and let the library infer it
- Partial data — anchoring the wafer centre for partial coverage, and why sparse data doesn't need it
- Bins and yield — named hard bins, pass/fail colours, yield label
- Test values — parametric measurements, spec limits, colorbar
- Retests — multi-touch probe sequences and retest policy
Interaction and control¶
- Display control — rotation, flip, plot mode, colour scheme
- Interaction API — hover, click, box-select, controller methods
- Lot gallery — card grid of multiple wafers with shared controls
- Web Worker — off-main-thread build for large datasets
- Custom colour schemes — register your own bin/value palette
Analysis and layout¶
- Statistical findings — ring, quadrant, cluster, edge-arc analysis
- Summary panel — persistent metadata and stats sidebar
- Lot-level findings — cross-wafer trend detection
- Lot-stack spatial analysis — mean/median/stddev maps across a lot
- Reticle overlays — photolithography field grid and reticle-position findings
- Real wafer data (WM-811K) — open dataset with 811 000 wafer records
- Mixed patterns (MixedWM38) — classified failure pattern dataset
Compatibility and advanced¶
- Rendering pipeline — low-level buildView / toCanvas pipeline
- wafermap vs Plotly.js — side-by-side render timings and feature comparison
Showcase — all features in one page, good for a quick overview once you know the basics.